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| ??? single in-line package Q outline ????? web ???u??E??? ?????????_J for details of outline dimensions, refer to our web site or the semiconductor short form catalog. as for the marking, refer to the specifcation marking, terminal connection. L unit : mm weight : 3.9gtyp. package 3s j534-1 188 sbd bridge d4sbs4 40v 4a ? s i p ??` ? sbd ?? ? v f ? thin-s i p ? sbd bridge ? low v f g
j ? ? $ p o u s p m / p
? 5 z q f / p ? ? g ? ? % b u f d p e f ? ? ? ? ? ? d4sb s4 0264 ? ? ? ? ? ? ratings d4sbs4 o? unit ? yy item g? symbol ye conditions
?y type no. - 9 s storage temperature ? ?9 s operation junction temperature d? ?o ?y maximum reverse voltage ?&`d? ??o ?y repetitive peak surge voltage z? ?v average rectified forward current ?&`d? ??o ?? repetitive peak surge reverse power d? ?? q ?v peak surge forward current ? 1y dielectric strength ? ?z??? mounting torque 5 t u h 5 k 7 3 . 7 3 3 4 . * 0 * ' 4 . 1 3 3 4 . 7 e j t 5 0 3 ) [ ym t| ??&` ???d? ? ?| 5 k ? 50hz sine wave, non-repetitive 1 cycle peak value, t j = 2 5 ? ? z?~-?| " $ 1c terminals to case, ac 1 minute * ? ? /~ n recommended torque : 0.5 n ~ m ? ? n t e v u z pulse width 0.5ms, duty 1/40 ? ? t ? ph?| 5 k ? pulse width 10 s, per diode, t j = 2 5 ? ??? ?v with heatsink ???s` without heatsink ) [ ym t| ? ?y 50hz sine wave, resistance load 5 d ? 5 b ? ? ? 7 7 " " 8 l 7 /~ n . " 9 . " 9 5 : 1 . " 9 . " 9 . " 9 7 n " q ' ? 8 q ?y forward voltage o ?v reverse current ?0? junction capacitance ? ? thermal resistance 7 ' * 3 $ k ? | ? ph?wf ? pulse measurement, per diode ? | ? ph?wf ? pulse measurement, per diode ? ?~ *?|???s` junction to ambient, without heatsink ? ?~???|???s` junction to lead, without heatsink ? ?~-?|??? ?v junction to case, with heatsink * ' " ? ph?wf ? per diode g . ) ; 7 3 7 7 3 7 3 . k d k l k b feature ? characteristic diagrams j534-1 189 thin s i p bridge d4sbs4 sine wave 50hz y?? 50hz sine wave is used for measurements. ?u?????????? typical ?y???g??? semiconductor products generally have characterristic variation. typical is a statistical average of the device's ability. |
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